Login / Signup
Experimental Evaluation of Circuit-Based Modeling of the NBTI Effects in Double-Gate FinFETs.
Nebojsa D. Jankovic
Chadwin D. Young
Published in:
Microelectron. Reliab. (2016)
Keyphrases
</>
experimental evaluation
knowledge base
field effect transistors
high speed
low cost
short circuit
analog vlsi
cmos technology
circuit design
modeling method
steady state
databases
expert systems
search algorithm
data structure
similarity measure
decision making
genetic algorithm