Manuel Quevedo-Lopez

Publication Activity (10 Years)

Years Active: 2018-2024
Publications (10 Years): 4

Top Topics

Voltage Stability

Gate Dielectrics

Silicon Nitride

Top Venues

Publications

Rodolfo A. Rodriguez-Davila, L. Fernandez-Izquierdo, J. Fink, T. Moise, Robert C. Baumann, B. Gnade, Manuel Quevedo-Lopez, Chadwin D. Young
Reliability Assessment of a-IGZO and ZnO Thin Film Transistors (TFTs) to X-ray irradiation. IRPS (2024)
Rodolfo A. Rodriguez-Davila, Richard A. Chapman, Massimo Catalano, Manuel Quevedo-Lopez, Chadwin D. Young
Enhanced Threshold Voltage Stability in ZnO Thin-Film-Transistors by Excess of Oxygen in Atomic Layer Deposited Al2O3. IRPS (2020)
Pavel Bolshakov, Rodolfo A. Rodriguez-Davila, Manuel Quevedo-Lopez, Chadwin D. Young
Positive Bias Instability in ZnO TFTs with Al2O3 Gate Dielectric. IRPS (2019)
Chadwin D. Young, Pavel Bolshakov, Rodolfo A. Rodriguez-Davila, Peng Zhao, Ava Khosravi, Israel Mejia, Manuel Quevedo-Lopez, Christopher L. Hinkle, Robert M. Wallace
Electrical characterization of process induced effects on non-silicon devices. ICICDT (2018)