Timing Vulnerability Factors of Ultra Deep-sub-micron CMOS.

Massoud Mokhtarpour Ghahroodi Mark Zwolinski Rick Wong Shi-Jie Wen

Published in: ETS (2011)

Keyphrases

micron cmos
high speed
factors affecting
factors that influence
data structure
risk assessment
factors influencing
data sets
decision trees
database systems
evolutionary algorithm
mobile robot
environmental factors