Soft Error Characterization of D-FFs at the 5-nm Bulk FinFET Technology for the Terrestrial Environment.
Yoni XiongAlexandra FeeleyN. J. PieperDennis R. BallBalaji NarasimhamJohn BrockmanN. A. DoddsS. A. WenderShi-Jie WenRita FungBharat L. BhuvaPublished in: IRPS (2022)