Login / Signup

Characterization and modeling of laser-induced single-event burn-out in SiC power diodes.

Nogaye MbayeVincent PougetFrédéric DarracqDean Lewis
Published in: Microelectron. Reliab. (2013)
Keyphrases
  • event detection
  • computer vision
  • decision trees
  • database systems
  • artificial neural networks
  • modeling language
  • modeling method
  • event recognition
  • power distribution