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TCAD simulation capabilities towards gate leakage current analysis of advanced AlGaN/GaN HEMT devices.
Kalparupa Mukherjee
Frédéric Darracq
Arnaud Curutchet
Nathalie Malbert
Nathalie Labat
Published in:
Microelectron. Reliab. (2017)
Keyphrases
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mathematical analysis
real time
image processing
color images
low cost
cost effective