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Short defect characterization based on TCR parameter extraction.

Abdellatif FiritiD. FaujourGérald HallerJ. M. MoraguesVincent GoubierPhilippe PerduFelix BeaudoinDean Lewis
Published in: Microelectron. Reliab. (2003)
Keyphrases
  • feature selection
  • automatic extraction
  • information extraction
  • machine learning
  • automatically extracted
  • data mining
  • input parameters
  • database
  • search algorithm
  • data streams
  • evolutionary algorithm
  • control system