J. M. Moragues

Publication Activity (10 Years)

Years Active: 2003-2005
Publications (10 Years): 0

Publications

Didier Goguenheim, Alain Bravaix, S. Gomri, J. M. Moragues, C. Monserie, N. Legrand, Philippe Boivin
Impact of wafer charging on hot carrier reliability and optimization of latent damage detection methodology in advanced CMOS technologies. Microelectron. Reliab. 45 (3-4) (2005)
Abdellatif Firiti, D. Faujour, Gérald Haller, J. M. Moragues, Vincent Goubier, Philippe Perdu, Felix Beaudoin, Dean Lewis
Short defect characterization based on TCR parameter extraction. Microelectron. Reliab. 43 (9-11) (2003)