N. Legrand

Publication Activity (10 Years)

Years Active: 2005-2005
Publications (10 Years): 0

Publications

Didier Goguenheim, Alain Bravaix, S. Gomri, J. M. Moragues, C. Monserie, N. Legrand, Philippe Boivin
Impact of wafer charging on hot carrier reliability and optimization of latent damage detection methodology in advanced CMOS technologies. Microelectron. Reliab. 45 (3-4) (2005)