Philippe Boivin

Publication Activity (10 Years)

Years Active: 2001-2007
Publications (10 Years): 0

Publications

Nicolas Baboux, C. Busseret, Carole Plossu, Philippe Boivin
Peculiarities of electron tunnel injection to the drain of EEPROMs. Microelectron. Reliab. 47 (4-5) (2007)
Didier Goguenheim, Alain Bravaix, S. Gomri, J. M. Moragues, C. Monserie, N. Legrand, Philippe Boivin
Impact of wafer charging on hot carrier reliability and optimization of latent damage detection methodology in advanced CMOS technologies. Microelectron. Reliab. 45 (3-4) (2005)
Nicolas Baboux, Carole Plossu, Philippe Boivin
Dynamic Fowler-Nordheim injection in EEPROM tunnel oxides at realistic time scales. Microelectron. Reliab. 45 (5-6) (2005)
Nicolas Baboux, Carole Plossu, Philippe Boivin
A new structure to monitor electrical transients during programming of EEPROM memory cells. Microelectron. Reliab. 44 (9-11) (2004)
Pierre Canet, Rachid Bouchakour, Nadia Harabech, Philippe Boivin, J. M. Mirabel
EEPROM programming study-time and degradation aspects. ISCAS (4) (2001)
Rachid Bouchakour, Nadia Harabech, Pierre Canet, Philippe Boivin, Jean Michel Mirable
Modeling of a floating-gate EEPROM cell using a charge sheet approach including variable tunneling capacitance and polysilicon gate depletion effect. ISCAS (4) (2001)