Peculiarities of electron tunnel injection to the drain of EEPROMs.

Nicolas Baboux C. Busseret Carole Plossu Philippe Boivin

Published in: Microelectron. Reliab. (2007)

Keyphrases

high speed
simulation model
early warning
electron beam
electron microscope
diesel engine
electric field
electron microscopy
high energy
case study
special case
van der waals
multiresolution
database systems
three dimensional
artificial intelligence
database