Login / Signup

Backside Defect Localizations and Revelations Techniques on Gallium Arsenide (GaAs) Devices.

Felix BeaudoinD. CarisettiRomain DesplatsPhilippe PerduDean LewisJ. C. Clement
Published in: Microelectron. Reliab. (2002)
Keyphrases
  • gallium arsenide
  • mobile devices
  • back propagation
  • defect detection
  • computer vision
  • information systems
  • real time
  • databases
  • neural network
  • clustering algorithm
  • fuzzy logic
  • input device