Login / Signup

Localization of Marginal Circuits for Yield Diagnostics Utilizing a Dynamic Laser Stimulation Probing System.

Joy Y. LiaoG. L. WoodsX. ChenHoward L. Marks
Published in: Microelectron. Reliab. (2005)
Keyphrases
  • dynamic environments
  • high speed
  • expert systems
  • real world
  • probability distribution
  • neural network
  • information systems
  • case study
  • data structure
  • dynamically changing
  • localization algorithm