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Overcoming Fault Test Coverage with Time-Resolved Emission (TRE) Probing.
Steven Kasapi
Bruce Cory
Published in:
Microelectron. Reliab. (2004)
Keyphrases
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fault diagnosis
test suite
expert systems
set of test cases
data mining
artificial intelligence
computer vision
real time
data sets
image analysis
test data
statistical significance
test generation