Charles R. Kime

Publication Activity (10 Years)

Years Active: 1966-1997
Publications (10 Years): 0

Publications

Danial J. Neebel, Charles R. Kime
Cellular Automata for Weighted Random Pattern Generation. IEEE Trans. Computers 46 (11) (1997)
Mohammed F. AlShaibi, Charles R. Kime
MFBIST: A BIST Method for Random Pattern Resistant Circuits. ITC (1996)
Kee Sup Kim, Charles R. Kime
Partial scan flip-flop selection by use of empirical testability. J. Electron. Test. 7 (1-2) (1995)
Byung S. So, Charles R. Kime
ICAT: incremental combinational ATPG. VTS (1994)
Danial J. Neebel, Charles R. Kime
Multiple weighted cellular automata. VTS (1994)
Mohammed F. AlShaibi, Charles R. Kime
Fixed-Biased Pseudorandom Built-In Self-Test for Random-Pattern-Resistant Circuits. ITC (1994)
Kee Sup Kim, Charles R. Kime
Partial Scan Using Reverse Direction Empirical Testability. ITC (1993)
Vishwani D. Agrawal, Charles R. Kime, Kewal K. Saluja
A Tutorial on Built-In Self-Test, Part 2: Applications. IEEE Des. Test Comput. 10 (2) (1993)
Byung S. So, Charles R. Kime
A fault simulation method: Parallel pattern critical path tracing. J. Electron. Test. 4 (3) (1993)
Danial J. Neebel, Charles R. Kime
Inhomogeneous Cellular Automata for Weighted-Random-Pattern Generation. ITC (1993)
Vishwani D. Agrawal, Charles R. Kime, Kewal K. Saluja
A Tutorial on Built-in Self-Test. I. Principles. IEEE Des. Test Comput. 10 (1) (1993)
John Y. Sayah, Charles R. Kime
Test Scheduling in High Performance VLSI System Implementations. IEEE Trans. Computers 41 (1) (1992)
Chau-Chin Su, Charles R. Kime
Computer-aided design of pseudoexhaustive BIST for semiregular circuits. ITC (1990)
Kee Sup Kim, Charles R. Kime
Partial Scan by Use of Empirical Testability. ICCAD (1990)
Chau-Chin Su, Charles R. Kime
Multiple path sensitization for hierarchical circuit testing. ITC (1990)
John Y. Sayah, Charles R. Kime
Scheduling unequal length tests in high performance VLSI system implementations. ICCD (1989)
Kewal K. Saluja, Rajiv Sharma, Charles R. Kime
A concurrent testing technique for digital circuits. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 7 (12) (1988)
John Y. Sayah, Charles R. Kime
: Test Scheduling for High Performance VLSI System Implementations. ITC (1988)
Gary L. Craig, Charles R. Kime, Kewal K. Saluja
Test Scheduling and Control for VLSI Built-In Self-Test. IEEE Trans. Computers 37 (9) (1988)
Charles R. Kime
Impact of Testability Standards on University Research and Instruction. ITC (1988)
Leon J. Sigal, Charles R. Kime
Concurrent Off-Phase Built-in Self-Test of Dormant Logic. ITC (1988)
Gary L. Craig, Charles R. Kime
Pseudo-Exhaustive Adjacency Testing: A BIST Approach for Stuck-Open Faults. ITC (1985)
John A. McPherson, Charles R. Kime
Diagnosis in the Presence of Known Faults. IEEE Trans. Computers 33 (10) (1984)
Charles R. Kime, H. H. Kwan, J. K. Lemke, Gerald B. Williams
A Built-In Test Methodology for VLSI Data Paths. ITC (1984)
Vincent C. Rideout, J. Eastman, Adel Said Elmaghraby, Raphael A. Finkel, A. A. Frank, T. J. Kaminsky, Charles R. Kime, John A. McPherson, Michael Jon Redmond, S. Diane Smith
WISPAC: A Parallel Array Computer for Simulation Applications. IMACS World Congress (1982)
John A. McPherson, Charles R. Kime
A Two-Level Diagnostic Model for Digital Systems. IEEE Trans. Computers 28 (1) (1979)
Charles R. Kime
An Abstract Model for Digital System Fault Diagnosis. IEEE Trans. Computers 28 (10) (1979)
Ramachendra P. Batni, Charles R. Kime
A Module-Level Testing Approach for Combinational Networks. IEEE Trans. Computers 25 (6) (1976)
Jeffrey D. Russell, Charles R. Kime
System Fault Diagnosis: Closure and Diagnosability with Repair. IEEE Trans. Computers 24 (11) (1975)
Gernot Metze, Donald R. Schertz, Kilin To, Gordon Whitney, Charles R. Kime, Jeffrey D. Russell
Comments on "Derivation of Minimal Complete Sets of Test-Input Sequences Using Boolean Differences". IEEE Trans. Computers 24 (1) (1975)
Charles R. Kime
Fault Tolerant Computing: An Introduction and a Perspective. IEEE Trans. Computers 24 (5) (1975)
Jeffrey D. Russell, Charles R. Kime
System Fault Diagnosis: Masking, Exposure, and Diagnosability Without Repair. IEEE Trans. Computers 24 (12) (1975)
Ramachendra P. Batni, Jeffrey D. Russell, Charles R. Kime
An Efficient Algorithm for Finding an Irredundant Set Cover. J. ACM 21 (3) (1974)
James C. Bassett, Charles R. Kime
Improved Procedures for Determining Diagnostic Resolution. IEEE Trans. Computers 21 (4) (1972)
Jeffrey D. Russell, Charles R. Kime
Structural Factors in the Fault Diagnosis of Combinational Networks. IEEE Trans. Computers 20 (11) (1971)
Charles R. Kime
An Analysis Model for Digital System Diagnosis. IEEE Trans. Computers 19 (11) (1970)
Charles R. Kime
An organization for checking experiments on sequential circuits. IEEE Trans. Electron. Comput. 15 (1) (1966)