Test Scheduling and Control for VLSI Built-In Self-Test.

Gary L. Craig Charles R. Kime Kewal K. Saluja

Published in: IEEE Trans. Computers (1988)

Keyphrases

built in self test
control system
flexible manufacturing systems
integrated circuit
signal processing
optimal control
control problems
case study
high speed
control strategy
control method
scheduling problem
test data
control theory
vlsi design