A Built-In Test Methodology for VLSI Data Paths.
Charles R. KimeH. H. KwanJ. K. LemkeGerald B. WilliamsPublished in: ITC (1984)
Keyphrases
- data sets
- data analysis
- statistical analysis
- database
- knowledge discovery
- multimedia data
- missing data
- image data
- raw data
- application domains
- data processing
- data points
- data sources
- relational databases
- training data
- computer systems
- data structure
- high dimensional data
- bayesian networks
- spatial data
- data mining algorithms
- information retrieval
- statistical methods
- data mining
- complex data