Pseudo-Exhaustive Adjacency Testing: A BIST Approach for Stuck-Open Faults.

Gary L. Craig Charles R. Kime

Published in: ITC (1985)

Keyphrases

built in self test
test cases
fault model
fault detection
fault diagnosis
test generation
model based diagnosis
real time
databases
test set
test data
exhaustive search
multi agent systems
similarity measure
software testing
search engine
learning algorithm