MFBIST: A BIST Method for Random Pattern Resistant Circuits.
Mohammed F. AlShaibiCharles R. KimePublished in: ITC (1996)
Keyphrases
- cost function
- high accuracy
- preprocessing
- significant improvement
- neural network
- main contribution
- support vector machine
- computational cost
- experimental evaluation
- prior knowledge
- data sets
- multiresolution
- pairwise
- feature space
- objective function
- edge detection
- theoretical analysis
- clustering method
- detection method
- mathematical model
- classification method
- fully automatic
- evaluation method