A concurrent testing technique for digital circuits.

Kewal K. Saluja Rajiv Sharma Charles R. Kime

Published in: IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. (1988)

Keyphrases

digital circuits
model based diagnosis
concurrent programs
data flow
finite state machines
circuit design
test cases
evolvable hardware
functional decomposition
databases
test set
concurrent programming
genetic algorithm
lower bound
dynamical systems
constraint satisfaction