Login / Signup
Accurate Layout-Dependent Effect Model in 10 nm-Class DRAM Process Using Area-Efficient Array Test Circuits.
Seyoung Kim
Seungho Yang
Hyein Lim
Hyein Lee
Jongwook Jeon
Jung Yun Choi
Jaeha Kim
Published in:
IEEE Access (2023)
Keyphrases
</>
computational model
process model
probabilistic model
test data
mathematical model
experimental data
conceptual model
neural network
decision trees
database systems
management system
computationally efficient
metamodel
recognition process