Jongwook Jeon

Publication Activity (10 Years)

Years Active: 2009-2024
Publications (10 Years): 7

Top Topics

Training Instances

Data Distribution

Top Venues

Microelectron. J.

Publications

Yonguk Sim, Choongseok Song, Eun Chan Park, Jongwook Jeon, Daewoong Kwon, Doo Seok Jeong
Optimal data distribution in FeFET-based computing-in-memory macros. ISCAS (2024)
Jiwook Hong, Jaewon Lim, Jongwook Jeon
Reduction of short-time image sticking in organic light-emitting diode display through transient analysis of low-temperature polycrystalline silicon thin-film transistor. Displays 84 (2024)
Sueyeon Kim, Insoo Choi, Sangki Cho, Myounggon Kang, Seungjae Baik, Changho Ra, Jongwook Jeon
Analysis of Logic-in-Memory Full Adder Circuit With Floating Gate Field Effect Transistor (FGFET). IEEE Access 11 (2023)
Jae Won Lim, Changhyun Yoo, Kiron Park, Jongwook Jeon
Self-Heating and Corner Rounding Effects on Time Dependent Dielectric Breakdown of Stacked Multi-Nanosheet FETs. IEEE Access 11 (2023)
Seyoung Kim, Seungho Yang, Hyein Lim, Hyein Lee, Jongwook Jeon, Jung Yun Choi, Jaeha Kim
Accurate Layout-Dependent Effect Model in 10 nm-Class DRAM Process Using Area-Efficient Array Test Circuits. IEEE Access 11 (2023)
Yeji Lee, Wonyeong Jang, Kyungbae Kwon, Jihun Park, Changhyun Yoo, Jeesoo Chang, Jongwook Jeon
Investigation on the Effects of Interconnect RC in 3nm Technology Node Using Path-Finding Process Design Kit. IEEE Access 10 (2022)
Hee-Sauk Jhon, Jongwook Jeon, Myunggon Kang
Extremely low power LNA biased with 0.25-V drain-to-source voltage for 3-to-5 GHz UWB-IR application. Microelectron. J. 61 (2017)
Jongwook Jeon, Ickhyun Song, Jong Duk Lee, Byung-Gook Park, Hyungcheol Shin
Application of the Compact Channel Thermal Noise Model of Short Channel MOSFETs to CMOS RFIC Design. IEICE Trans. Electron. (5) (2009)