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Self-Heating and Corner Rounding Effects on Time Dependent Dielectric Breakdown of Stacked Multi-Nanosheet FETs.
Jae Won Lim
Changhyun Yoo
Kiron Park
Jongwook Jeon
Published in:
IEEE Access (2023)
Keyphrases
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linear programming
artificial intelligence
approximation algorithms
information systems
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information retrieval
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case study
upper bound
worst case
steady state
travel time
electrical properties