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Investigation on the Effects of Interconnect RC in 3nm Technology Node Using Path-Finding Process Design Kit.
Yeji Lee
Wonyeong Jang
Kyungbae Kwon
Jihun Park
Changhyun Yoo
Jeesoo Chang
Jongwook Jeon
Published in:
IEEE Access (2022)
Keyphrases
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path finding
design process
power dissipation
data mining
genetic algorithm
user interface
high speed
nm technology
real time
dynamic programming
path planning