Hyungcheol Shin

Publication Activity (10 Years)

Years Active: 1998-2024
Publications (10 Years): 10

Top Topics

Modeling Method

Cochlear Implant

Top Venues

IEICE Electron. Express

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.

Publications

Quan Nguyen-Gia, Hyungcheol Shin
Modeling of Threshold Voltage Shift by Neighboring Transistors for Macaroni Channel MOSFETs in Series. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 43 (1) (2024)
Hyungjun Jo, Jongwoo Kim, Hyungcheol Shin
A Novel Read Scheme Using GIDL Current to Suppress Read Disturbance in 3-D nand Flash Memories. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 42 (12) (2023)
Jongwoo Kim, Hyungjun Jo, Yonggyu Cho, Hyunyoung Shim, Jaesung Sim, Hyungcheol Shin
Investigation of endurance degradation for 3-D charge trap NAND flash memory with bandgap-engineered tunneling oxide. IEICE Electron. Express 19 (24) (2022)
Sangmin Ahn, Hyungcheol Shin
Optimizing read disturb phenomenon with new read scheme by partial-boosting channel in 3-D NAND Flash memories. IEICE Electron. Express 18 (19) (2021)
Dong Chan Lee, Jang Kyu Lee, Hyungcheol Shin
Machine learning model for predicting threshold voltage by taper angle variation and word line position in 3D NAND flash memory. IEICE Electron. Express 17 (22) (2020)
Ilho Myeong, Juhyun Kim, Hyungwoo Ko, Ickhyun Song, Yongseok Kim, Hyungcheol Shin
A Simple and Accurate Modeling Method of Channel Thermal Noise Using BSIM4 Noise Models. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 39 (12) (2020)
Dong Chan Lee, Hyungcheol Shin
Transient program operation model considering distribution of electrons in 3D NAND flash memories. IEICE Electron. Express 17 (23) (2020)
Changbeom Woo, Shinkeun Kim, Jaeyeol Park, Hyungcheol Shin, Haesoo Kim, Gil-Bok Choi, Moon-Sik Seo, Keum Hwan Noh
Modeling of Charge Failure Mechanisms during the Short Term Retention Depending on Program/Erase Cycle Counts in 3-D NAND Flash Memories. IRPS (2020)
Sungyong Shin, Changmok Oh, Hyungcheol Shin
Tactile Tone System: A Wearable Device to Assist Accuracy of Vocal Pitch in Cochlear Implant Users. ASSETS (2020)
Hongjae Jang, Hyungcheol Shin, Jaemin Lee, Changwon Yoo, Kanghyup Chun, Ilhyun Yun
28.2 A 51dB-SNR 120Hz-Scan-Rate 32×18 Segmented-VCOM LCD In-Cell Touch-Display-Driver IC with 96-Channel Compact Shunt-Sensing Self-Capacitance Analog Front-End. ISSCC (2020)
Hongjae Jang, Hyungcheol Shin, Seunghoon Ko, Ilhyun Yun, Kwyro Lee
12.5 2D Coded-aperture-based ultra-compact capacitive touch-screen controller with 40 reconfigurable channels. ISSCC (2014)
Kyunghwan Lee, Duckseoung Kang, Hyungcheol Shin, Sangjin Kwon, Shinhyung Kim, Yuchul Hwang
Analysis of failure mechanisms in erased state of sub 20-nm NAND Flash memory. ESSDERC (2014)
Dyukyoung Moon, Hyunseul Lee, Changhwan Shin, Hyungcheol Shin
Analysis and modeling for random telegraph noise of GIDL current in saddle MOSFET for DRAM application. IEICE Electron. Express 11 (13) (2014)
Sang Wan Kim, Woo Young Choi, Min-Chul Sun, Hyun Woo Kim, Jongho Lee, Hyungcheol Shin, Byung-Gook Park
L-Shaped Tunneling Field-Effect Transistors for Complementary Logic Applications. IEICE Trans. Electron. (5) (2013)
Hyungcheol Shin, Seunghoon Ko, Hongjae Jang, Ilhyun Yun, Kwyro Lee
A 55dB SNR with 240Hz frame scan rate mutual capacitor 30×24 touch-screen panel read-out IC using code-division multiple sensing technique. ISSCC (2013)
Myounggon Kang, Ki-Whan Song, Byung-Gook Park, Hyungcheol Shin
The novel SCR-based ESD protection with low triggering and high holding voltages. Microelectron. J. 42 (6) (2011)
Seongjae Cho, Jung Hoon Lee, Yoon Kim, Jang-Gn Yun, Hyungcheol Shin, Byung-Gook Park
Simulation Study on Dependence of Channel Potential Self-Boosting on Device Scale and Doping Concentration in 2-D and 3-D NAND-Type Flash Memory Devices. IEICE Trans. Electron. (5) (2010)
Yoon Kim, Seongjae Cho, Gil Sung Lee, Il-Han Park, Jong Duk Lee, Hyungcheol Shin, Byung-Gook Park
3-Dimensional Terraced NAND (3D TNAND) Flash Memory-Stacked Version of Folded NAND Array. IEICE Trans. Electron. (5) (2009)
Seongjae Cho, Jung Hoon Lee, Gil Sung Lee, Jong Duk Lee, Hyungcheol Shin, Byung-Gook Park
Design Consideration for Vertical Nonvolatile Memory Device Regarding Gate-Induced Barrier Lowering (GIBL). IEICE Trans. Electron. (5) (2009)
Jongwook Jeon, Ickhyun Song, Jong Duk Lee, Byung-Gook Park, Hyungcheol Shin
Application of the Compact Channel Thermal Noise Model of Short Channel MOSFETs to CMOS RFIC Design. IEICE Trans. Electron. (5) (2009)
Doo-Hyun Kim, Il-Han Park, Seongjae Cho, Jong Duk Lee, Hyungcheol Shin, Byung-Gook Park
Simulation of Retention Characteristics in Double-Gate Structure Multi-Bit SONOS Flash Memory. IEICE Trans. Electron. (5) (2009)
Hochul Lee, Youngchang Yoon, Ickhyun Song, Hyungcheol Shin
FN Stress Induced Degradation on Random Telegraph Signal Noise in Deep Submicron NMOSFETs. IEICE Trans. Electron. (5) (2008)
Seongjae Cho, Il-Han Park, Jung Hoon Lee, Jang-Gn Yun, Doo-Hyun Kim, Jong Duk Lee, Hyungcheol Shin, Byung-Gook Park
Establishing Read Operation Bias Schemes for 3-D Pillar Structure Flash Memory Devices to Overcome Paired Cell Interference (PCI). IEICE Trans. Electron. (5) (2008)
Hochul Lee, Youngchang Yoon, Seongjae Cho, Hyungcheol Shin
Accurate Extraction of the Trap Depth from RTS Noise Data by Including Poly Depletion Effect and Surface Potential Variation in MOSFETs. IEICE Trans. Electron. (5) (2007)
Seongjae Cho, Jang-Gn Yun, Il-Han Park, Jung Hoon Lee, Jong Pil Kim, Jong Duk Lee, Hyungcheol Shin, Byung-Gook Park
Analyses on Current Characteristics of 3-D MOSFET Determined by Junction Doping Profiles for Nonvolatile Memory Devices. IEICE Trans. Electron. (5) (2007)
Kwangseok Han, Joonho Gil, Seong-Sik Song, Jeonghu Han, Hyungcheol Shin, Choong-Ki Kim, Kwyro Lee
Complete high-frequency thermal noise modeling of short-channel MOSFETs and design of 5.2-GHz low noise amplifier. IEEE J. Solid State Circuits 40 (3) (2005)
Minkyu Je, Jeonghu Han, Hyungcheol Shin, Kwyro Lee
A simple four-terminal small-signal model of RF MOSFETs and its parameter extraction. Microelectron. Reliab. 43 (4) (2003)
Joonho Gil, Minkyu Je, Jongho Lee, Hyungcheol Shin
A high speed and low power SOL inverter using active body-bias. ISLPED (1998)