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Modeling of Charge Failure Mechanisms during the Short Term Retention Depending on Program/Erase Cycle Counts in 3-D NAND Flash Memories.

Changbeom WooShinkeun KimJaeyeol ParkHyungcheol ShinHaesoo KimGil-Bok ChoiMoon-Sik SeoKeum Hwan Noh
Published in: IRPS (2020)
Keyphrases
  • short term
  • long term
  • short term and long term
  • stock market
  • flash memory
  • forecasting model
  • wind speed
  • solid state
  • load forecasting
  • long term memory
  • motion prediction
  • medium term
  • electric load forecasting
  • b tree