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Application of the Compact Channel Thermal Noise Model of Short Channel MOSFETs to CMOS RFIC Design.

Jongwook JeonIckhyun SongJong Duk LeeByung-Gook ParkHyungcheol Shin
Published in: IEICE Trans. Electron. (2009)
Keyphrases
  • noise model
  • high quality
  • noisy images
  • noise level
  • circuit design
  • face recognition
  • gaussian distribution
  • low voltage