Login / Signup

Analyses on Current Characteristics of 3-D MOSFET Determined by Junction Doping Profiles for Nonvolatile Memory Devices.

Seongjae ChoJang-Gn YunIl-Han ParkJung Hoon LeeJong Pil KimJong Duk LeeHyungcheol ShinByung-Gook Park
Published in: IEICE Trans. Electron. (2007)
Keyphrases
  • mobile devices
  • memory usage
  • data sets
  • database
  • neural network
  • case study
  • computing power
  • databases
  • data mining
  • machine learning
  • search engine
  • information processing
  • smart phones
  • random access