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Accurate Extraction of the Trap Depth from RTS Noise Data by Including Poly Depletion Effect and Surface Potential Variation in MOSFETs.
Hochul Lee
Youngchang Yoon
Seongjae Cho
Hyungcheol Shin
Published in:
IEICE Trans. Electron. (2007)
Keyphrases
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high quality
data sets
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xml documents
prior knowledge
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laser scanner
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