LASER SCANNER
Experts
- Jonathan Li
- Cheng Wang
- Zhu Li
- Mingqiang Wei
- Yulan Guo
- Ge Li
- Jun Wang
- Shan Liu
- Zhen Dong
- Juha Hyyppä
- Chenglu Wen
- Zhan Ma
- Xiaoshui Huang
- Guofeng Mei
- Li Li
- Yiling Xu
- Honghua Chen
- Fernando Pereira
- Ricardo L. de Queiroz
- Cyrill Stachniss
- Bisheng Yang
- Yu-Shen Liu
- Jian Yang
- Wei Hu
- Shaoyi Du
- Xuequan Lu
- Evangelos Alexiou
- Daniel Cohen-Or
- Harri Kaartinen
- Antero Kukko
- João Ascenso
- Ming Liu
- Ruofei Zhong
- Kai Xu
- Zhizhong Han
- Ruisheng Wang
- Andreas Nüchter
- Gim Hee Lee
- Jian Zhang
Venues
- CoRR
- Sensors
- Remote. Sens.
- CVPR
- IGARSS
- IEEE Access
- IROS
- ICRA
- IEEE Trans. Geosci. Remote. Sens.
- IEEE Trans. Instrum. Meas.
- ICIP
- ICCV
- IEEE Robotics Autom. Lett.
- IEEE Geosci. Remote. Sens. Lett.
- Int. J. Appl. Earth Obs. Geoinformation
- IEEE J. Sel. Top. Appl. Earth Obs. Remote. Sens.
- ISPRS Int. J. Geo Inf.
- IEEE Trans. Pattern Anal. Mach. Intell.
- ITSC
- IEEE Trans. Intell. Transp. Syst.
- ICME
- Comput. Graph.
- IEEE Trans. Circuits Syst. Video Technol.
- ICASSP
- IEEE SENSORS
- IEEE Trans. Image Process.
- VCIP
- Comput. Graph. Forum
- ROBIO
- ACM Multimedia
- Robotics Auton. Syst.
- AAAI
- 3DV
- Vis. Comput.
- Comput. Aided Des.
- IEEE Trans. Ind. Electron.
- Comput. Electron. Agric.
- Pattern Recognit.
- Neurocomputing
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