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Experts
- Luc Van Gool
- Hans-Peter Seidel
- Marco Di Renzo
- Tae-Kyun Kim
- Katsushi Ikeuchi
- Markus Vincze
- Hongbin Zha
- Pascal Fua
- Atsuhiro Nakamoto
- Nassir Navab
- Robert B. Fisher
- Shaoshuai Shi
- Joachim Hornegger
- Leonidas J. Guibas
- Hujun Bao
- Jean Ponce
- Mathieu Salzmann
- Hong Qin
- Qingqing Wu
- Bert Jüttler
- Hiroshi Kawasaki
- Jörg Peters
- Dragomir Anguelov
- Sven Behnke
- Gérard G. Medioni
- Xiang Bai
- Edwin R. Hancock
- Steven L. Waslander
- Roland Siegwart
- Xiaoqing Ye
- Federico Tombari
- Didier Stricker
- Ramesh Raskar
- Thomas W. Sederberg
- Ryo Furukawa
- Miroslav Lávicka
- Ales Leonardis
- Roberto Cipolla
- Sukhan Lee
Venues
- CoRR
- Sensors
- CVPR
- ICRA
- Remote. Sens.
- IROS
- IGARSS
- IEEE Access
- ICCV
- Comput. Aided Des.
- Comput. Aided Geom. Des.
- IEEE Trans. Geosci. Remote. Sens.
- IEEE Trans. Pattern Anal. Mach. Intell.
- Comput. Graph. Forum
- ACM Trans. Graph.
- IEEE Trans. Instrum. Meas.
- ICIP
- Comput. Graph.
- ICPR
- Vis. Comput.
- IEEE Trans. Vis. Comput. Graph.
- Pattern Recognit.
- ICASSP
- Comput. Vis. Image Underst.
- Image Vis. Comput.
- EMBC
- IEEE Robotics Autom. Lett.
- BMVC
- ROBIO
- IEEE Geosci. Remote. Sens. Lett.
- CVPR Workshops
- MVA
- IEEE Trans. Image Process.
- Appl. Math. Comput.
- Int. J. Comput. Vis.
- IEEE Trans. Ind. Electron.
- J. Comput. Phys.
- 3DIM
- SMC
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