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Experts
- Luc Van Gool
- Hans-Peter Seidel
- Marco Di Renzo
- Tae-Kyun Kim
- Katsushi Ikeuchi
- Pascal Fua
- Markus Vincze
- Hongbin Zha
- Robert B. Fisher
- Atsuhiro Nakamoto
- Shaoshuai Shi
- Nassir Navab
- Joachim Hornegger
- Leonidas J. Guibas
- Mathieu Salzmann
- Hong Qin
- Jean Ponce
- Hujun Bao
- Qingqing Wu
- Bert Jüttler
- Hiroshi Kawasaki
- Sven Behnke
- Gérard G. Medioni
- Dragomir Anguelov
- Jörg Peters
- Roland Siegwart
- Xiaoqing Ye
- Edwin R. Hancock
- Steven L. Waslander
- Xiang Bai
- Didier Stricker
- Federico Tombari
- Miroslav Lávicka
- Roberto Cipolla
- Ramesh Raskar
- Ryo Furukawa
- Ales Leonardis
- Thomas W. Sederberg
- Andreas Kolb
Venues
- CoRR
- Sensors
- CVPR
- ICRA
- Remote. Sens.
- IROS
- IGARSS
- IEEE Access
- ICCV
- Comput. Aided Des.
- IEEE Trans. Geosci. Remote. Sens.
- Comput. Aided Geom. Des.
- IEEE Trans. Pattern Anal. Mach. Intell.
- Comput. Graph. Forum
- IEEE Trans. Instrum. Meas.
- ACM Trans. Graph.
- ICIP
- Comput. Graph.
- ICPR
- ICASSP
- Vis. Comput.
- IEEE Trans. Vis. Comput. Graph.
- Pattern Recognit.
- Comput. Vis. Image Underst.
- IEEE Robotics Autom. Lett.
- Image Vis. Comput.
- EMBC
- IEEE Geosci. Remote. Sens. Lett.
- BMVC
- ROBIO
- CVPR Workshops
- MVA
- IEEE Trans. Image Process.
- 3DV
- J. Comput. Phys.
- Int. J. Comput. Vis.
- Appl. Math. Comput.
- AAAI
- IEEE Trans. Ind. Electron.
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