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The novel SCR-based ESD protection with low triggering and high holding voltages.
Myounggon Kang
Ki-Whan Song
Byung-Gook Park
Hyungcheol Shin
Published in:
Microelectron. J. (2011)
Keyphrases
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high levels
significantly lower
small size
data sets
low signal to noise ratio
high sensitivity
operating system
high precision
significantly higher
highly correlated
high correlation
electric field