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Simulation of Retention Characteristics in Double-Gate Structure Multi-Bit SONOS Flash Memory.
Doo-Hyun Kim
Il-Han Park
Seongjae Cho
Jong Duk Lee
Hyungcheol Shin
Byung-Gook Park
Published in:
IEICE Trans. Electron. (2009)
Keyphrases
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flash memory
dynamic characteristics
solid state
garbage collection
neural network
database
real time
similarity measure
open source
random access
buffer management
hand held devices