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Simulation of Retention Characteristics in Double-Gate Structure Multi-Bit SONOS Flash Memory.

Doo-Hyun KimIl-Han ParkSeongjae ChoJong Duk LeeHyungcheol ShinByung-Gook Park
Published in: IEICE Trans. Electron. (2009)
Keyphrases
  • flash memory
  • dynamic characteristics
  • solid state
  • garbage collection
  • neural network
  • database
  • real time
  • similarity measure
  • open source
  • random access
  • buffer management
  • hand held devices