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Hyungjun Jo
ORCID
Publication Activity (10 Years)
Years Active: 2022-2023
Publications (10 Years): 2
Top Topics
Storage Management
Flash Memory
B Tree
Garbage Collection
Top Venues
IEICE Electron. Express
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
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Publications
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Hyungjun Jo
,
Jongwoo Kim
,
Hyungcheol Shin
A Novel Read Scheme Using GIDL Current to Suppress Read Disturbance in 3-D nand Flash Memories.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
42 (12) (2023)
Jongwoo Kim
,
Hyungjun Jo
,
Yonggyu Cho
,
Hyunyoung Shim
,
Jaesung Sim
,
Hyungcheol Shin
Investigation of endurance degradation for 3-D charge trap NAND flash memory with bandgap-engineered tunneling oxide.
IEICE Electron. Express
19 (24) (2022)