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Investigation of endurance degradation for 3-D charge trap NAND flash memory with bandgap-engineered tunneling oxide.
Jongwoo Kim
Hyungjun Jo
Yonggyu Cho
Hyunyoung Shim
Jaesung Sim
Hyungcheol Shin
Published in:
IEICE Electron. Express (2022)
Keyphrases
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flash memory
solid state
metal oxide
garbage collection
random access
file system
main memory
buffer management
embedded systems
disk drives
b tree
database systems
storage management
storage systems
small size
data storage
hand held devices
fuel cell
data structure
management system
space charge
nearest neighbor