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Yuchul Hwang
Publication Activity (10 Years)
Years Active: 2014-2024
Publications (10 Years): 5
Top Topics
Solid State
Flash Memory
Early Detection
Garbage Collection
Top Venues
IRPS
ESSDERC
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Publications
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SungMan Rhee
,
Sung-Pyo Park
,
Sangku Park
,
Yuchul Hwang
,
Sangwoo Pae
,
Jun Meng
,
Yoonju Park
V-Ramp VBD Prediction Method Using OCD-Spectrum and Deep-Learning, and Application to Early Detection of V-NAND Low Metal Reliability Risk.
IRPS
(2024)
Taiki Uemura
,
Byungjin Chung
,
Jaehee Choi
,
Seungbae Lee
,
Shin-Young Chung
,
Yuchul Hwang
,
Sangwoo Pae
Soft-Error Sensitivity in SRAM Manufactured by Bulk Gate-All-Around (GAA) Technology.
IRPS
(2024)
Taiki Uemura
,
Byungjin Chung
,
Jaehee Choi
,
Seungbae Lee
,
Shin-Young Chung
,
Yuchul Hwang
,
Sangwoo Pae
Comprehensive Study of SER in FDSOI-Planar: 28 nm to 18 nm Scaling Effect and Temperature Dependence.
IRPS
(2024)
SungMan Rhee
,
Hyunjin Kim
,
Sangku Park
,
Taiki Uemura
,
Yuchul Hwang
,
Seungjin Choo
,
Jinju Kim
,
Hwasung Rhee
,
Shin-Young Chung
Machine Learning Based V-ramp VBD Predictive Model Using OCD-measured Fab Parameters for Early Detection of MOL Reliability Risk.
IRPS
(2023)
Taiki Uemura
,
Byungjin Chung
,
Shin-Young Chung
,
Seungbae Lee
,
Yuchul Hwang
,
Sangwoo Pae
Impact of Design and Process on Alpha-Induced SER in 4 nm Bulk-FinFET SRAM.
IRPS
(2023)
Kyunghwan Lee
,
Duckseoung Kang
,
Hyungcheol Shin
,
Sangjin Kwon
,
Shinhyung Kim
,
Yuchul Hwang
Analysis of failure mechanisms in erased state of sub 20-nm NAND Flash memory.
ESSDERC
(2014)