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V-Ramp VBD Prediction Method Using OCD-Spectrum and Deep-Learning, and Application to Early Detection of V-NAND Low Metal Reliability Risk.

SungMan RheeSung-Pyo ParkSangku ParkYuchul HwangSangwoo PaeJun MengYoonju Park
Published in: IRPS (2024)
Keyphrases
  • deep learning
  • early detection
  • pairwise
  • decision making
  • probabilistic model
  • image patches