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Jaehee Choi
Publication Activity (10 Years)
Years Active: 2020-2024
Publications (10 Years): 7
Top Topics
Statistical Significance
Flip Flops
Semiconductor Devices
Transmission Electron Microscopy
Top Venues
IRPS
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Publications
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Taiki Uemura
,
Byungjin Chung
,
Jaehee Choi
,
Seungbae Lee
,
Shin-Young Chung
,
Yuchul Hwang
,
Sangwoo Pae
Soft-Error Sensitivity in SRAM Manufactured by Bulk Gate-All-Around (GAA) Technology.
IRPS
(2024)
Taiki Uemura
,
Byungjin Chung
,
Jaehee Choi
,
Seungbae Lee
,
Shin-Young Chung
,
Yuchul Hwang
,
Sangwoo Pae
Comprehensive Study of SER in FDSOI-Planar: 28 nm to 18 nm Scaling Effect and Temperature Dependence.
IRPS
(2024)
Taiki Uemura
,
Byungjin Chung
,
Jegon Kim
,
Hyewon Shim
,
Shin-Young Chung
,
Brandon Lee
,
Jaehee Choi
,
Shota Ohnishi
,
Ken Machida
Accelerator-Based Thermal-Neutron Beam by Compact and Low-Cost Moderator for Soft-Error Evaluation in Semiconductor Devices.
IRPS
(2022)
Taiki Uemura
,
Byungjin Chung
,
Jegon Kim
,
Hyewon Shim
,
Shin-Young Chung
,
Brandon Lee
,
Jaehee Choi
,
Shota Ohnishi
,
Ken Machida
Thermal-Neutron SER Mitigation by Cobalt-Contact in 7 nm Bulk-FinFET Technology.
IRPS
(2022)
Taiki Uemura
,
Byungjin Chung
,
Jeongmin Jo
,
Mijoung Kim
,
Dalhee Lee
,
Gunrae Kim
,
Seungbae Lee
,
Taesjoong Song
,
Hwasung Rhee
,
Brandon Lee
,
Jaehee Choi
Soft-Error Susceptibility in Flip-Flop in EUV 7 nm Bulk-FinFET Technology.
IRPS
(2021)
Taiki Uemura
,
Byungjin Chung
,
Jeongmin Jo
,
Hai Jiang
,
Yongsung Ji
,
Tae-Young Jeong
,
Rakesh Ranjan
,
Seungbae Lee
,
Hwasung Rhee
,
Sangwoo Pae
,
Euncheol Lee
,
Jaehee Choi
,
Shota Ohnishi
,
Ken Machida
Backside Alpha-Irradiation Test in Flip-Chip Package in EUV 7 nm FinFET SRAM.
IRPS
(2020)
Taiki Uemura
,
Byungjin Chung
,
Jeongmin Jo
,
Hai Jiang
,
Yongsung Ji
,
Tae-Young Jeong
,
Rakesh Ranjan
,
Youngin Park
,
Kiil Hong
,
Seungbae Lee
,
Hwasung Rhee
,
Sangwoo Pae
,
Euncheol Lee
,
Jaehee Choi
,
Shota Ohnishi
,
Ken Machida
Investigating of SER in 28 nm FDSOI-Planar and Comparing with SER in Bulk-FinFET.
IRPS
(2020)