Investigating of SER in 28 nm FDSOI-Planar and Comparing with SER in Bulk-FinFET.
Taiki UemuraByungjin ChungJeongmin JoHai JiangYongsung JiTae-Young JeongRakesh RanjanYoungin ParkKiil HongSeungbae LeeHwasung RheeSangwoo PaeEuncheol LeeJaehee ChoiShota OhnishiKen MachidaPublished in: IRPS (2020)