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Investigating of SER in 28 nm FDSOI-Planar and Comparing with SER in Bulk-FinFET.

Taiki UemuraByungjin ChungJeongmin JoHai JiangYongsung JiTae-Young JeongRakesh RanjanYoungin ParkKiil HongSeungbae LeeHwasung RheeSangwoo PaeEuncheol LeeJaehee ChoiShota OhnishiKen Machida
Published in: IRPS (2020)
Keyphrases
  • neural network
  • information retrieval
  • machine learning
  • social networks
  • feature selection
  • optimal solution
  • viewpoint