Byungjin Chung

Publication Activity (10 Years)

Years Active: 2014-2024
Publications (10 Years): 11

Top Topics

Image Inpainting

Semiconductor Devices

Error Concealment

Intra Prediction

Top Venues

Inf. Process. Lett.

IEEE Trans. Circuits Syst. Video Technol.

Publications

Taiki Uemura, Byungjin Chung, Jaehee Choi, Seungbae Lee, Shin-Young Chung, Yuchul Hwang, Sangwoo Pae
Soft-Error Sensitivity in SRAM Manufactured by Bulk Gate-All-Around (GAA) Technology. IRPS (2024)
Taiki Uemura, Byungjin Chung, Jaehee Choi, Seungbae Lee, Shin-Young Chung, Yuchul Hwang, Sangwoo Pae
Comprehensive Study of SER in FDSOI-Planar: 28 nm to 18 nm Scaling Effect and Temperature Dependence. IRPS (2024)
Taiki Uemura, Byungjin Chung, Shin-Young Chung, Seungbae Lee, Yuchul Hwang, Sangwoo Pae
Impact of Design and Process on Alpha-Induced SER in 4 nm Bulk-FinFET SRAM. IRPS (2023)
Taiki Uemura, Byungjin Chung, Jegon Kim, Hyewon Shim, Shin-Young Chung, Brandon Lee, Jaehee Choi, Shota Ohnishi, Ken Machida
Accelerator-Based Thermal-Neutron Beam by Compact and Low-Cost Moderator for Soft-Error Evaluation in Semiconductor Devices. IRPS (2022)
Taiki Uemura, Byungjin Chung, Jegon Kim, Hyewon Shim, Shin-Young Chung, Brandon Lee, Jaehee Choi, Shota Ohnishi, Ken Machida
Thermal-Neutron SER Mitigation by Cobalt-Contact in 7 nm Bulk-FinFET Technology. IRPS (2022)
Taiki Uemura, Byungjin Chung, Jeongmin Jo, Mijoung Kim, Dalhee Lee, Gunrae Kim, Seungbae Lee, Taesjoong Song, Hwasung Rhee, Brandon Lee, Jaehee Choi
Soft-Error Susceptibility in Flip-Flop in EUV 7 nm Bulk-FinFET Technology. IRPS (2021)
Byungjin Chung, Changhoon Yim
Bi-Sequential Video Error Concealment Method Using Adaptive Homography-Based Registration. IEEE Trans. Circuits Syst. Video Technol. 30 (6) (2020)
Taiki Uemura, Byungjin Chung, Jeongmin Jo, Hai Jiang, Yongsung Ji, Tae-Young Jeong, Rakesh Ranjan, Seungbae Lee, Hwasung Rhee, Sangwoo Pae, Euncheol Lee, Jaehee Choi, Shota Ohnishi, Ken Machida
Backside Alpha-Irradiation Test in Flip-Chip Package in EUV 7 nm FinFET SRAM. IRPS (2020)
Taiki Uemura, Byungjin Chung, Jeongmin Jo, Hai Jiang, Yongsung Ji, Tae-Young Jeong, Rakesh Ranjan, Youngin Park, Kiil Hong, Seungbae Lee, Hwasung Rhee, Sangwoo Pae, Euncheol Lee, Jaehee Choi, Shota Ohnishi, Ken Machida
Investigating of SER in 28 nm FDSOI-Planar and Comparing with SER in Bulk-FinFET. IRPS (2020)
Hyeongyeom Ahn, Byungjin Chung, Changhoon Yim
Super-Resolution Convolutional Neural Networks Using Modified and Bilateral ReLU. ICEIC (2019)
Byungjin Chung, Changhoon Yim
Fast intra prediction method by adaptive number of candidate modes for RDO in HEVC. Inf. Process. Lett. 131 (2018)
Byungjin Chung, Changhoon Yim
Hybrid error concealment method combining exemplar-based image inpainting and spatial interpolation. Signal Process. Image Commun. 29 (10) (2014)