Brandon Lee

Publication Activity (10 Years)

Years Active: 2019-2022
Publications (10 Years): 7

Top Topics

Technological Advances

Semiconductor Devices

Top Venues

J. Digit. Imaging

Publications

Taiki Uemura, Byungjin Chung, Jegon Kim, Hyewon Shim, Shin-Young Chung, Brandon Lee, Jaehee Choi, Shota Ohnishi, Ken Machida
Accelerator-Based Thermal-Neutron Beam by Compact and Low-Cost Moderator for Soft-Error Evaluation in Semiconductor Devices. IRPS (2022)
Taiki Uemura, Byungjin Chung, Jegon Kim, Hyewon Shim, Shin-Young Chung, Brandon Lee, Jaehee Choi, Shota Ohnishi, Ken Machida
Thermal-Neutron SER Mitigation by Cobalt-Contact in 7 nm Bulk-FinFET Technology. IRPS (2022)
Taiki Uemura, Byungjin Chung, Jeongmin Jo, Mijoung Kim, Dalhee Lee, Gunrae Kim, Seungbae Lee, Taesjoong Song, Hwasung Rhee, Brandon Lee, Jaehee Choi
Soft-Error Susceptibility in Flip-Flop in EUV 7 nm Bulk-FinFET Technology. IRPS (2021)
Hai Jiang, Hyun-Chul Sagong, Jinju Kim, Hyewon Shim, Yoohwan Kim, Junekyun Park, Taiki Uemura, Yongsung Ji, Taeyoung Jeong, Dongkyun Kwon, Hwasung Rhee, Sangwoo Pae, Brandon Lee
Advanced Self-heating Model and Methodology for Layout Proximity Effect in FinFET Technology. IRPS (2020)
Tae-Young Jeong, Miji Lee, Yunkyung Jo, Jinwoo Kim, Min Kim, Myungsoo Yeo, Jinseok Kim, Hyunjun Choi, Joosung Kim, Yoojin Jo, Yongsung Ji, Taiki Uemura, Hai Jiang, Dongkyun Kwon, HwaSung Rhee, Sangwoo Pae, Brandon Lee
Reliability on EUV Interconnect Technology for 7nm and beyond. IRPS (2020)
Brandon Lee, Amanda Abbott, S. Davidson, Leonid Syrkin, Greg LeFever, Annick D. Van den Abbeele
Centralized Clinical Trial Imaging Data Management: Practical Guidance from a Comprehensive Cancer Center's Experience. J. Digit. Imaging 32 (5) (2019)
Ghil-Geun Oh, Jong-Ho Eun, Shin-Young Chung, Brandon Lee
Advanded Design Verification and Debugging Techniques Based on Optical Fault Isolation Method. ISOCC (2019)