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Taeyoung Jeong
Publication Activity (10 Years)
Years Active: 2018-2024
Publications (10 Years): 7
Top Topics
Cyber Defense
Imperative Programs
Cmos Image Sensor
Early Diagnosis
Top Venues
IRPS
BWCCA
Adv. Intell. Syst.
SIGMOD Conference
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Publications
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Sangmin Oh
,
Taeyoung Jeong
,
Junghwan Yum
,
Minhyuk Lim
,
Yoohwan Kim
,
Bongyong Jeong
,
Jeongmin Jo
,
Hyewon Shim
,
Shin-Young Chung
,
Paul Jung
An Analysis of CDM-induced BTI-like Degradation using VF-TLP in Advanced FinFET Technology.
IRPS
(2024)
Jihun Kim
,
Hyo Cheon Woo
,
Taeyoung Jeong
,
Jung-Hae Choi
,
Cheol Seong Hwang
In-Depth Analysis of One Selector-One Resistor Crossbar Array for Its Writing and Reading Operations for Hardware Neural Network with Finite Wire Resistance.
Adv. Intell. Syst.
4 (4) (2022)
Insu Oh
,
Eunseon Jeong
,
Junyoung Park
,
Taeyoung Jeong
,
Junghoon Park
,
Kangbin Yim
Cyber Attack Scenarios in Cooperative Automated Driving.
BWCCA
(2020)
Kisung Park
,
Taeyoung Jeong
,
Chanho Jeong
,
Jaeha Lee
,
Dong-Hun Lee
,
Young-Koo Lee
ProcAnalyzer: Effective Code Analyzer for Tuning Imperative Programs in SAP HANA.
SIGMOD Conference
(2020)
Hai Jiang
,
Hyun-Chul Sagong
,
Jinju Kim
,
Hyewon Shim
,
Yoohwan Kim
,
Junekyun Park
,
Taiki Uemura
,
Yongsung Ji
,
Taeyoung Jeong
,
Dongkyun Kwon
,
Hwasung Rhee
,
Sangwoo Pae
,
Brandon Lee
Advanced Self-heating Model and Methodology for Layout Proximity Effect in FinFET Technology.
IRPS
(2020)
Heung-Kook Ko
,
Sena Park
,
Jihyun Ryu
,
Sung Ryul Kim
,
Giwon Lee
,
Dongjoon Lee
,
Sangwoo Pae
,
Euncheol Lee
,
Yongsun Ji
,
Hai Jiang
,
Taeyoung Jeong
,
Taiki Uemura
,
Dongkyun Kwon
,
Hyungrok Do
,
Hyungu Kahng
,
Yoon-Sang Cho
,
Jiyoon Lee
,
Seoung Bum Kim
Early Diagnosis and Prediction of Wafer Quality Using Machine Learning on sub-10nm Logic Technology.
IRPS
(2020)
Younggeun Ji
,
Jeonghoon Kim
,
Jungin Kim
,
Miji Lee
,
Jaeheon Noh
,
Taeyoung Jeong
,
Juhyeon Shin
,
Junho Kim
,
Young Heo
,
Ung Cho
,
Hyun-Chul Sagong
,
Junekyun Park
,
Yeonsik Choo
,
Gilhwan Do
,
Hoyoung Kang
,
Eunkyeong Choi
,
Dongyoon Sun
,
Changki Kang
,
Sangchul Shin
,
Sangwoo Pae
Reliability characterization of advanced CMOS image sensor (CIS) with 3D stack and in-pixel DTI.
IRPS
(2018)