Reliability characterization of advanced CMOS image sensor (CIS) with 3D stack and in-pixel DTI.
Younggeun JiJeonghoon KimJungin KimMiji LeeJaeheon NohTaeyoung JeongJuhyeon ShinJunho KimYoung HeoUng ChoHyun-Chul SagongJunekyun ParkYeonsik ChooGilhwan DoHoyoung KangEunkyeong ChoiDongyoon SunChangki KangSangchul ShinSangwoo PaePublished in: IRPS (2018)