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Euncheol Lee
Publication Activity (10 Years)
Years Active: 2015-2022
Publications (10 Years): 8
Top Topics
Low Light
Measurement Error
Nm Technology
Machine Learning
Top Venues
IRPS
Imaging Sensors and Systems
ISCAS
Eur. J. Oper. Res.
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Publications
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Seongkyung Kim
,
Ukjin Jung
,
Seungjin Choo
,
Kihyun Choi
,
Tae-Jin Chung
,
Shin-Young Chung
,
Euncheol Lee
,
Juhun Park
,
Deokhan Bae
,
Myungyoon Um
Middle-of-the-Line Reliability Characterization of Recessed-Diffusion-Contact Adopted sub-5nm Logic Technology.
IRPS
(2022)
Daeyong Shim
,
Chunseok Jeong
,
Euncheol Lee
,
Junmo Kang
,
Seokcheol Yoon
,
Yongkee Kwon
,
Il Park
,
Hyun Ahn
,
Seonyong Cha
,
Jinkook Kim
Holistic approaches to memory solutions for the Autonomous Driving Era.
ISCAS
(2022)
Moon Soo Lee
,
Inhak Baick
,
Min Kim
,
Seo Hyun Kwon
,
Myeong Soo Yeo
,
Hwasung Rhee
,
Euncheol Lee
Chip to Package Interaction Risk Assessment of FCBGA Devices using FEA Simulation, Meta-Modeling and Multi-Objective Genetic Algorithm Optimization Technique.
IRPS
(2021)
Hai Jiang
,
Jinju Kim
,
Kihyun Choi
,
Hyewon Shim
,
Hyunchul Sagong
,
Junekyun Park
,
Hwasung Rhee
,
Euncheol Lee
Time Dependent Variability in Advanced FinFET Technology for End-of-Lifetime Reliability Prediction.
IRPS
(2021)
Euncheol Lee
,
Hyunsu Jun
,
Wonho Choi
,
Kihyun Kwon
,
Jihyung Lim
,
Seunghak Lee
,
Joonseo Yim
CIS Band Noise Prediction Methodology Using Co-Simulation of Camera Module.
Imaging Sensors and Systems
(2020)
Taiki Uemura
,
Byungjin Chung
,
Jeongmin Jo
,
Hai Jiang
,
Yongsung Ji
,
Tae-Young Jeong
,
Rakesh Ranjan
,
Seungbae Lee
,
Hwasung Rhee
,
Sangwoo Pae
,
Euncheol Lee
,
Jaehee Choi
,
Shota Ohnishi
,
Ken Machida
Backside Alpha-Irradiation Test in Flip-Chip Package in EUV 7 nm FinFET SRAM.
IRPS
(2020)
Taiki Uemura
,
Byungjin Chung
,
Jeongmin Jo
,
Hai Jiang
,
Yongsung Ji
,
Tae-Young Jeong
,
Rakesh Ranjan
,
Youngin Park
,
Kiil Hong
,
Seungbae Lee
,
Hwasung Rhee
,
Sangwoo Pae
,
Euncheol Lee
,
Jaehee Choi
,
Shota Ohnishi
,
Ken Machida
Investigating of SER in 28 nm FDSOI-Planar and Comparing with SER in Bulk-FinFET.
IRPS
(2020)
Heung-Kook Ko
,
Sena Park
,
Jihyun Ryu
,
Sung Ryul Kim
,
Giwon Lee
,
Dongjoon Lee
,
Sangwoo Pae
,
Euncheol Lee
,
Yongsun Ji
,
Hai Jiang
,
Taeyoung Jeong
,
Taiki Uemura
,
Dongkyun Kwon
,
Hyungrok Do
,
Hyungu Kahng
,
Yoon-Sang Cho
,
Jiyoon Lee
,
Seoung Bum Kim
Early Diagnosis and Prediction of Wafer Quality Using Machine Learning on sub-10nm Logic Technology.
IRPS
(2020)
Hojung Shin
,
Soohoon Park
,
Euncheol Lee
,
W. C. Benton
A classification of the literature on the planning of substitutable products.
Eur. J. Oper. Res.
246 (3) (2015)