Jinju Kim

Publication Activity (10 Years)

Years Active: 2018-2023
Publications (10 Years): 9

Top Topics

Early Detection

Predictive Model

Health Insurance

Top Venues

Int. J. Medical Informatics

Microelectron. Reliab.

Publications

SungMan Rhee, Hyunjin Kim, Sangku Park, Taiki Uemura, Yuchul Hwang, Seungjin Choo, Jinju Kim, Hwasung Rhee, Shin-Young Chung
Machine Learning Based V-ramp VBD Predictive Model Using OCD-measured Fab Parameters for Early Detection of MOL Reliability Risk. IRPS (2023)
Seonglim Lee, Jaehye Suk, Jinsook Kim, Jinu Jung, Jinju Kim
Do ICT Competence in and ICT Service Use Affect Life Satisfaction? Focusing on Mobile ICT Services. HCI (48) (2022)
Neta Yodovich, Jinju Kim
YouTube Channel. Games Cult. 17 (5) (2022)
Myonghwa Park, Linh Bui Khanh, Miri Jeong, Eun Jeong Choi, Nayoung Lee, Minjung Kwak, Jahyeon Kim, Jinju Kim, Jihye Jung, Thi-Thanh-Tinh Giap, Hyunjeong Guk, Junsik Na
ICT-based person-centered community care platform (IPC3P) to enhance shared decision-making for integrated health and social care services. Int. J. Medical Informatics 156 (2021)
Hai Jiang, Jinju Kim, Kihyun Choi, Hyewon Shim, Hyunchul Sagong, Junekyun Park, Hwasung Rhee, Euncheol Lee
Time Dependent Variability in Advanced FinFET Technology for End-of-Lifetime Reliability Prediction. IRPS (2021)
Hai Jiang, Hyun-Chul Sagong, Jinju Kim, Hyewon Shim, Yoohwan Kim, Junekyun Park, Taiki Uemura, Yongsung Ji, Taeyoung Jeong, Dongkyun Kwon, Hwasung Rhee, Sangwoo Pae, Brandon Lee
Advanced Self-heating Model and Methodology for Layout Proximity Effect in FinFET Technology. IRPS (2020)
Hai Jiang, Hyun-Chul Sagong, Jinju Kim, Junekyun Park, Sangchul Shin, Sangwoo Pae
Localized Layout Effect Related Reliability Approach in 8nm FinFETs Technology: From Transistor to Circuit. IRPS (2019)
Minjung Jin, Kangjung Kim, Yoohwan Kim, Hyewon Shim, Jinju Kim, Gunrae Kim, Sangwoo Pae
gate stack. Microelectron. Reliab. 81 (2018)
Hyunjin Kim, Minjung Jin, Hyun-Chul Sagong, Jinju Kim, Ukjin Jung, Minhyuck Choi, Junekyun Park, Sangchul Shin, Sangwoo Pae
A systematic study of gate dielectric TDDB in FinFET technology. IRPS (2018)