Sign in

Reliability on EUV Interconnect Technology for 7nm and beyond.

Tae-Young JeongMiji LeeYunkyung JoJinwoo KimMin KimMyungsoo YeoJinseok KimHyunjun ChoiJoosung KimYoojin JoYongsung JiTaiki UemuraHai JiangDongkyun KwonHwaSung RheeSangwoo PaeBrandon Lee
Published in: IRPS (2020)
Keyphrases
  • high speed
  • rapid development
  • expert systems
  • real time
  • data processing
  • personal computer
  • key technologies
  • st century
  • technological advances
  • data mining
  • infrared
  • cost effective
  • high end
  • cmos technology