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Comprehensive Study of SER in FDSOI-Planar: 28 nm to 18 nm Scaling Effect and Temperature Dependence.

Taiki UemuraByungjin ChungJaehee ChoiSeungbae LeeShin-Young ChungYuchul HwangSangwoo Pae
Published in: IRPS (2024)
Keyphrases
  • transmission electron microscopy
  • data sets
  • machine learning
  • d objects
  • infrared
  • planar surfaces
  • single point