Login / Signup
Soft-Error Sensitivity in SRAM Manufactured by Bulk Gate-All-Around (GAA) Technology.
Taiki Uemura
Byungjin Chung
Jaehee Choi
Seungbae Lee
Shin-Young Chung
Yuchul Hwang
Sangwoo Pae
Published in:
IRPS (2024)
Keyphrases
</>
cmos technology
power consumption
case study
cost effective
low power
data transmission
error rate
sensitivity analysis
rapid development
data processing
cost function
key technologies
st century
error detection
technological advances
bit rate
data structure
personal computer
database