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Analysis of failure mechanisms in erased state of sub 20-nm NAND Flash memory.

Kyunghwan LeeDuckseoung KangHyungcheol ShinSangjin KwonShinhyung KimYuchul Hwang
Published in: ESSDERC (2014)
Keyphrases
  • flash memory
  • general purpose
  • data sets
  • case study
  • data analysis
  • solid state
  • garbage collection
  • random access