FN Stress Induced Degradation on Random Telegraph Signal Noise in Deep Submicron NMOSFETs.
Hochul LeeYoungchang YoonIckhyun SongHyungcheol ShinPublished in: IEICE Trans. Electron. (2008)
Keyphrases
- random noise
- additive noise
- low signal to noise ratio
- white noise
- received signal
- wide band
- signal detection
- noisy environments
- signal to noise ratio
- response function
- noise variance
- impulse response
- stochastic resonance
- image degradation
- frequency domain
- signal processing
- low frequency
- noise level
- noise model
- high frequency
- original signal
- noise reduction
- low snr
- additive gaussian noise
- noise elimination
- quantization noise
- short time fourier transform
- vlsi circuits
- direct sequence spread spectrum
- slowly varying
- power spectra
- sampled data
- power spectrum
- pixel intensities
- noisy images
- missing data
- non stationary
- weak signal
- image quality
- single channel
- degraded images
- nonlinear filters
- bandpass
- signal subspace
- image noise
- biomedical signals
- speech recognition